This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2021, 12, 913–923, doi:10.3762/bjnano.12.68
Figure 1: (a) SEM image of a micropatterned Nb/Co multilayer. The sample contains twelve contacts, six horizo...
Figure 2: Longitudinal magnetoresistances for a horizontal bridge at S2, measured at different T. (a) At the ...
Figure 3: (a) Magnetoresistance of a horizontal bridge on the S1 sample, T = 7.29 K. (b) FORC analysis of MR ...
Beilstein J. Nanotechnol. 2019, 10, 833–839, doi:10.3762/bjnano.10.83
Figure 1: The normalized critical current of the S/F/s/F/S (solid lines) and S/F/N/F/S (dashed lines) structu...
Figure 2: (a) The depth profile of the superconducting pair potential amplitude of the S/[F1/s/F2/s]5/F1/S st...
Figure 3: Experimental (dots) specular neutron reflectivity measured at T = 13 K in magnetic fields H = 300 O...
Figure 4: (a) Magnetic depth profiles of one unit cell for the P (black) and AP (red) alignment. Correspondin...